The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2020

Filed:

Mar. 18, 2019
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Seiji Abe, Kawasaki, JP;

Yumi Yanai, Yokohama, JP;

Tetsuya Edamura, Inagi, JP;

Junichi Nakagawa, Tokyo, JP;

Kouta Murasawa, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/21 (2006.01); H04N 1/40 (2006.01); H04N 1/405 (2006.01);
U.S. Cl.
CPC ...
B41J 2/2139 (2013.01); B41J 2/2142 (2013.01); H04N 1/4053 (2013.01); H04N 1/40087 (2013.01);
Abstract

From among a plurality of elements included in a printing head and arrayed in a predetermined direction, a faulty element that is unable to form dots properly on a printing medium is identified. At least one of correction processing for increasing a value of multi-valued input image data corresponding to the faulty element and correction processing for decreasing a threshold in a quantization process for the faulty element is performed. Complementary dot data is generated for the faulty element by taking the dot data generated for the identified faulty element as dot data corresponding to an element near the identified faulty element in the predetermined direction.


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