The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2020

Filed:

Jun. 06, 2016
Applicant:

Rensselaer Polytechnic Institute, Troy, NY (US);

Inventors:

Ge Wang, Loudonville, NY (US);

Qingsong Yang, Troy, NY (US);

Wenxiang Cong, Albany, NY (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01); G06T 11/00 (2006.01); G21H 5/02 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5205 (2013.01); A61B 6/037 (2013.01); G06T 11/005 (2013.01); G21H 5/02 (2013.01);
Abstract

Systems and methods for determining an attenuation sinogram for a time-of-flight (TOF) positron emission tomography (PET) scan using only TOF PET data, and including use of the total amount of tracer provided to the subject of the TOF PET scan, are provided. The total amount of injected tracer can be used to determine the otherwise unknown constant shift present when an attenuation sinogram is estimated using the gradient of the attenuation sinogram. The attenuation sinogram can therefore be accurately and stably determined without any additional knowledge on the attenuation sinogram or map.


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