The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Jan. 19, 2017
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Inventors:
Jin-Kyu Hong, Seongnam-si, KR;
Se-Jin Kim, Seoul, KR;
Jae-Ho Song, Suwon-si, KR;
Byung-Wook Kim, Suwon-si, KR;
Myung-Hoon Yeon, Yongin-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); H04B 17/318 (2015.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04B 17/318 (2015.01); H04W 24/10 (2013.01);
Abstract
A measurement method by a user equipment (UE) including receiving a first measurement list from a base station, the first measurement list including one or more measurement candidates, and measuring signal quality of at least some of the one or more measurement candidates independent of corresponding one or more measurement periods, the one or more measurement periods being periods determined for the at least some of the one or more measurement candidates may be provided.