The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Feb. 12, 2015
Qualcomm Incorporated, San Diego, CA (US);
Mastooreh Salajegheh, San Jose, CA (US);
Govindarajan Krishnamurthi, Palo Alto, CA (US);
Rajarshi Gupta, Sunnyvale, CA (US);
Mihai Christodorescu, San Jose, CA (US);
Vinay Sridhara, Santa Clara, CA (US);
Patrick Hughes, Dana Point, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Systems, methods, and devices of the various aspects enable detecting a malfunction caused by radio frequency (RF) interference. A computing device processor may identify a location of the computing device based on a plurality of real-time data inputs received by the computing device. The processor may characterize an RF environment of the computing device based on the identified location and the plurality of real-time data inputs. The processor may determine at least one RF emissions threshold based on the characterization of the RF environment. The processor may compare the characterization of the RF environment to the at least one RF emissions threshold, and may perform an action in response to determining that the characterization of the RF environment exceeds the at least one RF emissions threshold.