The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Jun. 28, 2018
Applicant:

Homerun Labs, Inc., Denver, CO (US);

Inventors:

Anthony Russell Wilbert, Denver, CO (US);

Jacob Alter Lozow, Denver, CO (US);

Assignee:

HOMERUN LABS, INC., Denver, CO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 4/02 (2018.01); G06T 7/20 (2017.01); G01S 19/13 (2010.01); G01C 21/12 (2006.01); G06T 7/73 (2017.01); H04W 84/12 (2009.01);
U.S. Cl.
CPC ...
H04W 4/026 (2013.01); G01C 21/12 (2013.01); G01S 19/13 (2013.01); G06T 7/20 (2013.01); G06T 7/74 (2017.01); H04W 84/12 (2013.01);
Abstract

In an aspect of the disclosure, a method, a computer-readable medium, and an apparatus are provided. The apparatus may include an imager, an inertial measurement unit, and a processing system. The imager may be configured to capture an image. The inertial measurement unit may have an output. The processing system may be configured to collect positional information indicating a position of the computing device in response to the output from the inertial measurement unit. Further, the processing system may be configured to determine a selected structure captured in the image. Further, the processing system may be configured to identify information corresponding to the selected structure based on the positional information.


Find Patent Forward Citations

Loading…