The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Nov. 10, 2016
Applicant:

Mcafee, Llc, Santa Clara, CA (US);

Inventors:

Srikanth Nalluri, Bangalore, IN;

Dattatraya Kulkarni, Bangalore, IN;

Raja Sinha, Bangalore, IN;

Venkatasubrahmanyam Krishnapur, Bangalore, IN;

Yogesh Jain, Cupertino, CA (US);

Kaushal Kumar Dhruw, Bangalore, IN;

Kamlesh Halder, Bangalore, IN;

Assignee:

McAfee, LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04M 11/04 (2006.01); H04M 1/2745 (2006.01); G06F 16/951 (2019.01); G06Q 50/26 (2012.01); H04W 8/22 (2009.01); H04M 19/04 (2006.01); G06F 21/62 (2013.01); H04W 88/02 (2009.01); H04W 4/14 (2009.01);
U.S. Cl.
CPC ...
H04M 1/274583 (2013.01); G06F 16/951 (2019.01); G06Q 50/265 (2013.01); H04M 19/04 (2013.01); H04W 8/22 (2013.01); G06F 21/6245 (2013.01); H04W 4/14 (2013.01); H04W 88/02 (2013.01);
Abstract

A safety event is determined as affecting a user based at least in part context data collected at a user device associated with the user. In some aspects, context data is detected from sensors on the client device, the context data describing a present context of the user. A deviation of the present context from a historical context is determined to be beyond a threshold. Determining that the deviation is beyond the threshold can be determined to correspond to a safety event potentially jeopardizing safety of the user. In some aspects, an action can be launched in response to determining the safety event.


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