The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Jun. 17, 2015
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Yu Cao, Beijing, CN;

Simon Tao, Shanghai, CN;

Xiaoyan Guo, Beijing, CN;

Kenneth Durazzo, San Ramon, CA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); G06F 15/16 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
H04L 43/045 (2013.01); G06F 3/0604 (2013.01); G06F 3/0638 (2013.01); G06F 15/16 (2013.01);
Abstract

A computing system is monitored by collecting monitoring information from two or more different monitoring tools associated with respective portions of the computing system, where the monitoring tools having different information collection capabilities associated therewith. The monitoring information received from the different monitoring tools is consolidated in a unified data store. The unified data store is utilized to perform analytics relating to inter-dependencies of storage, compute and networking components of the computing system managed by different ones of the monitoring tools. The analytics results are presented utilizing a monitoring dashboard.


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