The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Sep. 21, 2018
Analog Devices, Inc., Norwood, MA (US);
Eric Otte, Boston, MA (US);
ANALOG DEVICES, INC., Norwood, MA (US);
Abstract
An ADC can include a plurality of time-interleaved ADCs to increase the overall sampling rate of the ADC. Such an ADC can have interleaving errors, since the time-interleaved ADCs in the ADC are not always perfectly matched. One way to calibrate for these mismatches is by observing the digital output signals of the time-interleaved ADCs in the background, or more broadly, without knowledge of the input signal to the ADC (often referred to as 'blind' calibration). Due to the nature of these calibrations, the performance of the calibration would significantly degrade when the input signal has certain problematic input conditions, such as a certain coherent input frequency. To address this issue, the data being used for calibration of interleaving errors can go through a qualifying process to assess whether to update error estimates based on the data.