The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

May. 25, 2017
Applicant:

Shenyang Neusoft Medical Systems Co., Ltd., Shenyang, CN;

Inventors:

Shaolian Liu, Shenyang, CN;

Zhipeng Sun, Shenyang, CN;

Yunda Li, Shenyang, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01); A61B 6/04 (2006.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/003 (2013.01); A61B 6/037 (2013.01); A61B 6/0457 (2013.01); A61B 6/4208 (2013.01); A61B 6/4241 (2013.01); A61B 6/5205 (2013.01); G06T 11/008 (2013.01);
Abstract

Methods, devices, and apparatus, including computer programs encoded on a computer storage medium for reconstructing image are provided. In one aspect, a method of reconstructing image includes obtaining scanning data for a subject in a continuous incremental scanning of medical equipment including real crystals for detection, associating each of the real crystals with one or more virtual crystals in a virtual scanning system, determining delay random coincidence data of two virtual crystals connected by a response line in the virtual scanning system, obtaining random coincidence data by denoising the delay random coincidence data based on crystal receiving efficiency for each of the real crystals, and reconstructing an image with the scanning data by taking the random coincidence data into account.


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