The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Jun. 10, 2013
Abb Research Ltd., Zurich, CH;
Karen J. Smiley, Raleigh, NC (US);
Chihhung Hou, Morrisville, NC (US);
Randall R. Schrieber, Cary, NC (US);
Shakeel M. Mahate, Raleigh, NC (US);
Other;
Abstract
Among other things, one or more techniques and/or systems are provided for developing a criticality profile of an industrial asset. The criticality profile describes the importance of the industrial asset to a system in terms of one or more criticality metrics and/or one or more confidence profiles. Such metrics may include an operational metric indicative of the operation impact of the industrial asset on a system if the industrial asset remains unchanged or enters a degraded or improved state, a restoration metric indicative of a complexity of restoring the industrial asset to an operational state from the unchanged or degraded state and/or complexity of improving the industrial asset to an improved state, and/or an interdependency metric indicative of a relationship between the industrial asset and one or more other industrial assets and/or between the industrial asset and one or more structures in an environment associated with the industrial asset.