The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Aug. 05, 2014
Applicant:

California Institute of Technology, Pasadena, CA (US);

Inventors:

Yaser Said Abu-Mostafa, Pasadena, CA (US);

Carlos Roberto Gonzalez, Pasadena, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06K 9/6256 (2013.01); G06N 5/003 (2013.01);
Abstract

Technologies are generally described for methods and systems in a machine learning environment. In some examples, a method may include retrieving training data from a memory. The training data may include training inputs and training labels. The methods may further include determining a set of datasets based on the training inputs. The methods may further include determining a set of out of sample errors based on the training inputs and based on test data. Each out of sample error may correspond to a respective dataset in the set of datasets. The methods may further include generating alternative distribution data based on the set of out of sample errors. The alternative distribution data may be used to determine weights to be applied to the training data.


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