The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Aug. 31, 2015
International Business Machines Corporation, Armonk, NY (US);
Takayuki Osogami, Tokyo, JP;
Raymond H. Rudy, Tokyo, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
An apparatus for estimating a characteristic of a posterior distribution includes a sampling section configured to generate a plurality of samples from a prior distribution, an obtaining section configured to obtain, for each sample among the plurality of samples, a likelihood of observation given the sample, a calculation section configured to calculate a parameter relating to a density at each sample in the prior distribution, and an estimation section configured to estimate, for the plurality of samples, a characteristic of the posterior distribution based on the parameter relating to the density at each sample and the likelihood of observation for each sample.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile