The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Jul. 10, 2018
Applicants:

Kuan-yu LU, Taipei, TW;

Wei-hsin Huang, Taipei, TW;

Wei-hung Chang, Taipei, TW;

Chun-shing Chu, Taipei, TW;

Inventors:

Kuan-Yu Lu, Taipei, TW;

Wei-Hsin Huang, Taipei, TW;

Wei-Hung Chang, Taipei, TW;

Chun-Shing Chu, Taipei, TW;

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/00 (2006.01); G06K 9/68 (2006.01); G06T 17/20 (2006.01); G06T 5/50 (2006.01); G06T 7/20 (2017.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
G06K 9/4661 (2013.01); G06K 9/00288 (2013.01); G06K 9/68 (2013.01); G06T 5/50 (2013.01); G06T 7/20 (2013.01); G06T 7/521 (2017.01); G06T 17/20 (2013.01); G06T 2207/10048 (2013.01);
Abstract

A multi-frequency high-precision object recognition method is disclosed, wherein a multi-frequency light emitting unit is used to emits lights of different frequencies onto an object-to-be-tested, and a multi-frequency image sensor unit is used to fetch the image of lights reflected from the object-to-be-tested. In an X axis and a Y axis is a single-piece planar image, while lights of different frequencies is used to form image depth in a Z axis. The sample light in the Z axis includes two infrared light narrow range image signals, each having wavelength between 850 nm and 1050 nm, and wavelength width between 10 nm and 60 nm. Calculate to obtain a plurality of single-piece planar images in the X axis and the Y axis as sampled by different wavelength widths in the Z axis, superimpose the plurality of single-piece planar images into a 3-dimension stereoscopic relief image for precise comparison and recognition.


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