The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Apr. 03, 2017
System and method for locating and performing fine grained classification from multi-view image data
California Institute of Technology, Pasadena, CA (US);
Eth Zurich, Zurich, CH;
Pietro Perona, Altadena, CA (US);
Steven J. Branson, Pasadena, CA (US);
Jan D. Wegner, Zurich, CH;
David C. Hall, Pasadena, CA (US);
California Institute of Technology, Pasadena, CA (US);
Abstract
Some embodiments of the invention provide a method for identifying geographic locations and for performing a fine-grained classification of elements detected in images captured from multiple different viewpoints or perspectives. In several embodiments, the method identifies the geographic locations by probabilistically combining predictions from the different viewpoints by warping their outputs to a common geographic coordinate frame. The method of certain embodiments performs the fine-grained classification based on image portions from several images associated with a particular geographic location, where the images are captured from different perspectives and/or zoom levels.