The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Apr. 10, 2018
Applicant:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Inventor:

Eric W. Schieve, Austin, TX (US);

Assignee:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/504 (2013.01); G06F 17/5045 (2013.01);
Abstract

Methods for designing a processor based on executing a randomly created and randomly executed executable on a fabricated processor. By implementing randomization at multiple levels in the testing of the processor, coupled with highly specific test generation constraint rules, highly focused tests on a micro-architectural feature are implemented while at the same time applying a high degree of random permutation in the way it stresses that specific feature. This allows for the detection and diagnosis of errors and bugs in the processor that elude traditional testing methods. Once the errors and bugs are detected and diagnosed, the processor can then be redesigned to no longer produce the anomalies. By eliminating the errors and bugs in the processor, a processor with improved computational efficiency and reliability can be fabricated.


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