The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Dec. 14, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Guan Jun Liu, Beijing, CN;

Niao Qing Liu, Beijing, CN;

Ai Lian Mi, Beijing, CN;

Jing Jing Wen, Beijing, CN;

Bei Chun Zhou, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/366 (2013.01); G06F 11/3624 (2013.01);
Abstract

According to one embodiment, a method, computer system, and computer program product for memory corruption diagnosis is provided. The present invention may include generating a pattern expression (PE) header file, wherein a plurality of common datatypes associated with a software program are pre-defined. The invention may further include generating a PE for each of the plurality of common datatypes, and generating a PE table by merging the generated PEs for each of the plurality of common datatypes. Upon discovery that memory corruption has occurred, the invention may include transmitting a recorded state of the software program as a core dump file to a server, and using a dump utility to identify overlay content of the core dump file. Lastly, the invention may include identifying a possible source program of the memory corruption by matching the PE tables against the illegally-written overlay content.


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