The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Jul. 18, 2017
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Shogo Inoue, Yamanashi, JP;

Takashi Hosaka, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/406 (2006.01);
U.S. Cl.
CPC ...
G05B 19/406 (2013.01); G05B 2219/35257 (2013.01); G05B 2219/35263 (2013.01); G05B 2219/37074 (2013.01);
Abstract

An operation management system configured to acquire measured values of a workpiece from a numerical controller which controls a machine tool to measure the workpiece is provided with a measurement macro receiving unit configured to read a measurement macro for controlling the measurement from the numerical controller, a measurement macro analysis unit configured to analyze the measurement macro to identify the name of a measurement result variable loaded with the measured values, and a measurement result read-out unit configured to read out the value of the measurement result variable from the numerical controller. The operation management system easily acquires the result of the workpiece measurement from the numerical controller.


Find Patent Forward Citations

Loading…