The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Jun. 22, 2018
Applicant:

Kromek Group, Plc, Sedgefield, County Durham, GB;

Inventors:

James William Hugg, Mars, PA (US);

Ian Radley, Durham, GB;

Assignee:

KROMEK GROUP, PLC, Sedgefield, County Durham, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
G01T 1/247 (2013.01); A61B 6/037 (2013.01); A61B 6/0457 (2013.01); A61B 6/4241 (2013.01); A61B 6/4258 (2013.01); A61B 6/485 (2013.01); A61B 6/502 (2013.01); G01T 1/249 (2013.01);
Abstract

One embodiment provides a method, including: receiving a dataset associated with a plurality of photon emission events interacting with a detector array of an imaging device; identifying a first subset of the dataset associated with a plurality of unscattered photon emission events from the plurality of photon emission events; identifying a second subset of the dataset associated with at least one scattered photon event from the plurality of photon emission events; determining, for a scattered photon event, a likely location of emission of the scattered photon event using data from the first subset of the dataset associated with the plurality of unscattered photon events; and correcting the dataset by associating the scattered photon event with the determined likely location of emission. Other aspects are described and claimed.


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