The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Nov. 19, 2015
Applicant:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Inventors:

Kohei Kawazoe, Tokyo, JP;

Takahiro Kubota, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 17/42 (2006.01); G01S 17/89 (2006.01); B61L 15/00 (2006.01); G01S 7/481 (2006.01);
U.S. Cl.
CPC ...
G01S 17/42 (2013.01); B61L 15/0081 (2013.01); G01S 7/4817 (2013.01); G01S 7/4865 (2013.01); G01S 17/89 (2013.01);
Abstract

A laser light source; a light sending lens configured to form laser light emitted from the laser light source into a spot shape; a scanner configured to perform irradiation while performing scanning, with the laser light formed into the spot shape, in a horizontal direction and a vertical direction of an area to be measured; a light receiving lens configured to receive reflected light reflected from the area to be measured; a light receiving optical system configured to condense the reflected light received by the light receiving lens, in each of the horizontal direction and vertical direction; and an information generating unit configured to generate, based on a received signal output by the light receiving element, three dimensional information of the area to be measured.


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