The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Apr. 13, 2016
Topcon Corporation, Tokyo-to, JP;
Hideyuki Matsumoto, Tokyo-to, JP;
Yasushi Tanaka, Tokyo-to, JP;
Shoji Hayashi, Tokyo-to, JP;
Takaaki Saito, Tokyo-to, JP;
TOPCON Corporation, Tokyo-to, JP;
Abstract
The invention provides a three-dimensional surveying instrument, which comprises a light emitter for emitting a distance measuring light, a light projecting optical unit for irradiating a distance measuring light from the light emitter along a distance measuring optical axis, a light receiving optical unit for receiving a reflection light from an object to be measured, a photodetection element for converting the reflection light as focused at the light receiving optical unit to an electric signal, a scanning unit for scanning a distance measuring light with respect to the object to be measured provided on a frame unit, angle detecting units for detecting an irradiating direction of the distance measuring light as scanned by the scanning unit, a vibration detecting unit for detecting vibration amount of the frame unit, and a control arithmetic unit having a storage unit where a threshold value is stored, wherein the control arithmetic unit controls so that the number of rotations of the scanning unit is gradually increased from low rotation number to the maximum rotation number, stores in the storage unit by associating the number of rotations with vibration amount as detected, compares vibration amount corresponding to the number of rotations as calculated based on measurement conditions with the threshold value, and performs measurement on the object to be measured in a case where it is judged that vibration amount corresponding to the number of rotations as calculated is lower than the threshold value.