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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10534061 B1

PDFFull Text
Date of Patent:
Jan. 14, 2020

Filed:

Apr. 04, 2016

Calibration arrangement and a method for a microwave analyzing or measuring instrument

Applicant:

Gapwaves Ab, Göteborg, SE;

Inventors:

Vessen Vassilev, Lindome, SE;

Per-Simon Kildal, Pixbo, SE;

Sofia Rahiminejad, Göteborg, SE;

Assignee:

GAPWAVES AB, Gothenburg, SE;

Attorneys:

Jeffrey S. Melcher

Melcher Patent Law PLLC

Primary Examiner:

Minh N Tang

Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 35/00 (2006.01); G01R 27/28 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01); G01R 27/28 (2013.01);
Abstract

An apparatus for calibration of an electronic instrument, such as a vector network analyzer, includes a number of calibrator connector elements for connection to the instrument, and a plate element including a plurality of calibration waveguide structures. The plate element has conductive surfaces, and the calibrator connector elements and conductive surfaces include periodic structures disposed with respect to each other such that gaps are formed between them. An interface enables interconnection of a waveguide of a calibrator connector element, a waveguide of the instrument, and a calibration waveguide structure. The apparatus includes a driving unit and controller for moving the plate element and/or the calibrator connector element to connect the calibrator connector element to different calibration waveguide structures.

Find Patent Forward Citations

Vassilev, Vessen. (2020). Calibration arrangement and a method for a microwave analyzing or measuring instrument (U.S. Patent No. 10534061). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10534061

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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