The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Sep. 06, 2017
Applicant:

Fluke Corporation, Everett, WA (US);

Inventors:

Ronald Steuer, Hinterbruhl, AT;

Peter Radda, Vitis, AT;

Assignee:

FLUKE CORPORATION, Everett, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 25/00 (2006.01); G01R 23/02 (2006.01);
U.S. Cl.
CPC ...
G01R 25/005 (2013.01); G01R 23/02 (2013.01);
Abstract

Systems and methods that measure electrical parameters of a multi-phase electrical system may utilize a multi-phase measurement device that includes a sensor subsystem that has a voltage sensor and a current sensor. Each of the voltage sensor and the current sensor may be a contact-type sensor or a 'non-contact' sensor that does not require galvanic contact. In operation, a multi-phase measurement device may utilize the voltage sensor and the current sensor to sequentially obtain single phase measurements for each phase of a multi-phase electrical system. The measurements may be synchronized to obtain various multi-phase power parameters, such as various parameters relating to power, phase, voltage, current, etc. The multi-phase measurement device may be operative to automatically detect when an operator has positioned a sensor of the sensor subsystem proximate a conductor under test so the multi-phase measurement device can initiate detection of one or more electrical parameters in the conductor.


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