The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Mar. 02, 2018
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventor:

Fumihito Inukai, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02J 7/00 (2006.01); G01R 19/257 (2006.01); G01R 31/382 (2019.01); G01R 31/3835 (2019.01); H03K 5/24 (2006.01); G01R 31/396 (2019.01); G01R 19/165 (2006.01);
U.S. Cl.
CPC ...
G01R 19/257 (2013.01); G01R 31/382 (2019.01); G01R 31/3835 (2019.01); H03K 5/24 (2013.01); G01R 19/16542 (2013.01); G01R 31/396 (2019.01);
Abstract

An analogue measurement data detection system according to the present invention includes: a reference voltage generation circuit configured to generate and output a reference voltage; an analogue/digital converter configured to compare an analogue signal with the reference voltage outputted from the reference voltage generation circuit, and based on a differential voltage between the analogue signal and the reference voltage, generate and output a digital signal corresponding to the analogue signal. The reference voltage generation circuit is configured to cause the reference voltage to have such a temperature characteristic as to compensate for temperature characteristics of at least the analogue/digital converter and the reference voltage generation circuit.


Find Patent Forward Citations

Loading…