The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Jan. 16, 2019
Guzik Technical Enterprises, Mountain View, CA (US);
Anatoli B. Stein, Altherton, CA (US);
Alexander Taratorin, Palo Alto, CA (US);
Valeriy Serebryanskiy, Santa Clara, CA (US);
Guzik Technical Enterprises, Mountain View, CA (US);
Abstract
A method and apparatus for resolving time base-generated errors from sampling scope-based measurements. Mutually synchronized repetitive waveform-to-be-analyzed signals (WAS) and repetitive sinusoidal reference signals (RS) are respectively applied to a first channel and a second channel of a sampling scope. A time base generator applies a sampling signal to the first and second channels. An average sine wave period Tfor k samples of RS is determined, followed by determination of phase error φfor each of the k samples, corresponding to phase differences between an ideal sine wave signal and the applied reference sinusoidal signal. Time base error values dfor k samples are calculated from d=φ*Tπ. Error values dcorrect time base errors in the sampling signal, and the WAS is re-sampled at sampling times adjusted by d.