The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Mar. 14, 2017
Omron Corporation, Kyoto-shi, Kyoto, JP;
Hirotada Teranishi, Osaka, JP;
Takahiro Sakai, Moriyama, JP;
OMRON Corporation, Kyoto-shi, JP;
Abstract
A probe pin includes an elastic portion, a first contact portion having a pair of leg portions that extends from a first end of the elastic portion along a longitudinal direction and is bendable in a direction away from each other, and that has a pair of contact portions each of which is disposed at each tip of the pair of leg portion and is urged by the elastic portion in a direction along the longitudinal direction through the pair of leg portions to be able to be brought into contact with a projecting contact of an inspection object, and a second contact portion that is disposed at a second end of the elastic portion and is electrically connected to the first contact portion. Between the pair of leg portions, a gap into which the projecting contact of the inspection object can be inserted is provided, and in a state where the projecting contact is inserted into the gap, the pair of contact portions and the projecting contact can be brought into contact with each other.