The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Nov. 27, 2015
Electricite DE France, Paris, FR;
Nicolas Paul, Montreuil, FR;
Pierre-Louis Filiot, Paris, FR;
Electricite de France, , FR;
Abstract
A method for detecting and characterizing defects in a heterogeneous material via ultrasound. The method includes the following steps: emitting ultrasound waves from an emitting ultrasound transducer placed against the material; acquiring, using a receiving ultrasound transducer in various positions relative to the material, a plurality of time signals, representing the amplitude of the sound propagated in the material as a function of time, for a position of the receiving ultrasound transducer; determining a time function representing a spatially averaged power of the time signals that correspond to different positions of the receiving transducer; and—normalizing the time signals by the time function so as to obtain normalized time signals. The defects in the material are detected from the normalized tune signal.