The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Mar. 21, 2017
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Stephan Schmitz, Cologne, DE;

Stephan Falter, Simmerath, DE;

Wolfgang Dick, Kreuzau, DE;

Thomas Weise, Weilerswist, DE;

Matthias Schwabe, Cologne, DE;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/28 (2006.01); G01N 29/27 (2006.01);
U.S. Cl.
CPC ...
G01N 29/27 (2013.01); G01N 29/043 (2013.01); G01N 29/28 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/106 (2013.01); G01N 2291/262 (2013.01);
Abstract

An ultrasonic matrix phased array inspection system can include a plurality of curved matrix phased array probes surrounding a test chamber through which a longitudinal test object passes. Fluid injectors can provide a rotating fluid jacket around the longitudinal test object to ultrasonically couple the plurality of curved matrix phased array probes to the longitudinal test object. The plurality of curved matrix phased array probes can remain in a fixed position during inspection and can inspect the longitudinal test object by transmitting ultrasonic sound waves at various angles to identify flaws of any orientation.


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