The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Sep. 19, 2016
Canon Kabushiki Kaisha, Tokyo, JP;
Takashi Seki, Tokyo, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
A measuring device for measuring an object includes a controller, a projector, an imaging unit, and a processor, the controller controls the projector and the imaging unit to start projection and imaging in a second condition after starting projection and imaging in a first condition, and to start imaging in the second condition with a time interval of an integer multiple of a period of intensity of light other than a pattern of light from an imaging start time in the first condition, and the processor obtains intersection point positions of gradation values between image data obtained at the same imaging time in each condition among image data obtained at each imaging time in the first condition and image data obtained at each imaging time in the second condition, and calculates the shape information based on the obtained intersection point positions.