The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Jun. 15, 2016
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

German Garcia, Katy, TX (US);

Hadrien Dumont, Houston, TX (US);

Vinay K. Mishra, Katy, TX (US);

Li Chen, Katy, TX (US);

Abhishek Agarwal, Sugar Land, TX (US);

Cosan Ayan, Clamart, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 49/08 (2006.01); E21B 49/10 (2006.01); G01N 33/24 (2006.01); G01N 21/31 (2006.01); G01N 21/94 (2006.01);
U.S. Cl.
CPC ...
E21B 49/088 (2013.01); E21B 49/10 (2013.01); G01N 33/24 (2013.01); G01N 21/31 (2013.01); G01N 21/94 (2013.01);
Abstract

A formation sampling method includes disposing a downhole tool comprising a packer and an expandable probe within a wellbore. The method also includes performing pressure transient testing by setting the expandable packer and the probe to engage a wall of the wellbore and measuring a pressure response at the expandable packer and the probe while withdrawing formation fluid into the downhole tool through the expandable packer. The method further includes monitoring a contamination level of the formation fluid during the pressure transient testing, and performing formation sampling with the probe in response to determining that the monitored contamination level meets a predetermined threshold.


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