The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
May. 17, 2019
Denka Company Limited, Chuo-ku, Tokyo, JP;
National Institutes for Quantum and Radiological Science and Technology, Chiba-shi, Chiba, JP;
National University Corporation Gunma University, Maebashi-shi, Gunma, JP;
Wataru Kada, Maebashi, JP;
Kenta Miura, Maebashi, JP;
Osamu Hanaizumi, Maebashi, JP;
Tomihiro Kamiya, Takasaki, JP;
Takahiro Satoh, Takasaki, JP;
Junichi Susaki, Tokyo, JP;
Suzuya Yamada, Machida, JP;
Denka Company Limited, Chuo-Ku, Tokyo, JP;
National University Corporation Gunma University, Maebashi-Shi, Gunma, JP;
National Institutes For Quantum And Radiological Science And Technology, Chiba-Shi, Chiba, JP;
Abstract
Provided are a charged particle radiation measuring method and a charged particle radiation measuring device using a scintillator comprising a phosphor in which the main component is a SiAlON phosphor.