The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Feb. 22, 2017
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Gabriel de Albuquerque Gleizer, Rio de Janeiro, BR;

Carlos Gonzaga, Rio de Janeiro, BR;

Lucas Vargas, Rio de Janeiro, BR;

Harry Kirk Matthews, Jr., Niskayuna, NY (US);

Assignee:

GE GLOBAL SOURCING LLC, Norwalk, CT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B61L 3/02 (2006.01); B61L 3/00 (2006.01); B61L 15/00 (2006.01); B61L 27/00 (2006.01);
U.S. Cl.
CPC ...
B61L 3/008 (2013.01); B61L 3/006 (2013.01); B61L 3/02 (2013.01); B61L 15/0027 (2013.01); B61L 15/0072 (2013.01); B61L 27/0027 (2013.01); B61L 27/0038 (2013.01); B61L 27/0055 (2013.01); B61L 2201/00 (2013.01);
Abstract

System includes a control system used to control operation of a vehicle system as the vehicle system moves along a route. The vehicle system includes a plurality of system vehicles in which adjacent system vehicles are operatively coupled such that the adjacent system vehicles are permitted to move relative to one another. The control system includes one or more processors that are configured to (a) receive operational settings of the vehicle system and (b) input the operational settings into a system model of the vehicle system to determine an observed metric of the vehicle system. The one or more processors are also configured to (c) compare the observed metric to a reference metric and (d) modify the operational settings of the vehicle system based on differences between the observed and the reference metrics.


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