The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Sep. 06, 2018
Fujifilm Corporation, Tokyo, JP;
Yoshirou Yamazaki, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are a printing result inspection apparatus, a method, and a program capable of determining a printing defect caused by a printing step and a printing paper defect caused by printing paper by reading the printing paper once. A printing result inspection apparatusaccepts designation of paper defect information used for determining a defected region through an operation unit. A defect determination unitdetermines whether defected regions D, D, and Dextracted from a non-image region Aare the printing defect or the printing paper defect based on designated paper defect information, a density change amount, and a color, and an image feature amount of a defected region determined as the printing paper defect in the non-image region Ais stored in paper defect information Iand is accumulated in a paper defect information storage unit. The defect determination unitperforms the determination of defected regions Dand Dextracted from image regions Aand Abased on the designated paper defect information, stored paper defect information relating to printing paper Pbeing inspected, and the paper defect information I