The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Sep. 28, 2018
The Boeing Company, Chicago, IL (US);
Luke C. Ingram, Summerville, SC (US);
Anthony W. Baker, Gilbertsville, PA (US);
Zachary R. Smith, Hanahan, SC (US);
The Boeing Company, Chicago, IL (US);
Abstract
A method of collecting a metrology data set of a contoured surface with a metrology system and executing an automatic control plan for printing on a contoured surface is disclosed. The method includes attaching a work piece to a work piece frame and scanning a contoured surface of the work piece to obtain a metrology data set, a three-dimensional point cloud model is generated based on the metrology data set. Additionally, the method includes defining a spatial reference model of the work piece frame, and defining a print path for a print head assembly of a surface treatment assembly. Furthermore, the method includes discretizing the contoured surface into a plurality of regions and the print path is further defined into at least one independent regional print path for each region of the plurality of regions. Moreover, a computer software simulation verifies a control plan for printing on the contoured surface.