The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
May. 25, 2018
Hewlett-packard Development Company, L.p., Houston, TX (US);
Xavier Quintero Ruiz, Sant Cugat del Valles, ES;
Roma Segura Fabregas, Barcelona, ES;
Marcos Casaldaliga, Sant Cugat del Valles, ES;
Hewlett-Packard Development Company, L.P., Spring, TX (US);
Abstract
In some examples, a printer includes neighboring nozzle arrays extending across a print zone, each nozzle array of the neighboring nozzle arrays extending along an axis and comprising a first section of nozzles and a second section of nozzles, wherein the second sections of the neighboring nozzle arrays overlap defining an overlap region and the first sections of the neighboring nozzle arrays define non-overlap regions. A controller is to cause printing of a test pattern using the neighboring nozzle arrays, the test pattern comprising a first pattern printed by the second sections of the neighboring nozzle arrays in the overlap region, and a reference pattern printed by a first section of the first sections of the neighboring nozzle arrays in a non-overlap region of the non-overlap regions, receive detected characteristics of the printed test pattern, compare the characteristics of the printed test pattern in the overlap region and in the non-overlap region, and derive alignment information based on the comparing.