The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Feb. 25, 2019
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Carl Zeiss Industrial Metrology, Llc, Maple Grove, MN (US);
Marcin B. Bauza, Plymouth, MN (US);
Richard H. Knebel, Brighton, MI (US);
Thomas Engel, Aalen, DE;
Nils Haverkamp, Aalen, DE;
Rainer Sagemueller, Aalen, DE;
Dominik Seitz, Schwaebisch Gmuend, DE;
Tobias Held, Noerdlingen, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Carl Zeiss Industrial Metrology, LLC, Maple Grove, MN (US);
Abstract
A method of producing a workpiece by using additive manufacturing techniques includes obtaining computer-aided design data representing the workpiece in multiple layers. The method includes providing build platforms and layer tools. Each layer tool is moveable relative to a respective build platform and configured to generate or solidify a material layer on the respective build platform. The method includes producing a first defined material layer of the workpiece on a first build platform by controlling a first layer tool according to a first layer definition. The method includes transferring the first defined material layer from the first build platform to a second build platform and measuring the first defined material layer using a first measuring head to measure individual characteristics. The method includes producing further material layers of the workpiece by controlling a second layer tool in accordance with further layer definitions as a function of the measured individual characteristics.