The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Jul. 31, 2018
Fanuc Corporation, Yamanashi, JP;
Yoshitaka Kubo, Yamanashi, JP;
Fanuc Corporation, Yamanashi, JP;
Abstract
Quality judgment on a laser beam intensity distribution is performed by taking an observation condition of the laser beam into consideration. A machine learning device includes: a state observing means that acquires data indicating an intensity distribution of a laser beam and data indicating a condition for observing the laser beam, performed to generate the data indicating the intensity distribution as input data; a label acquisition means that acquires an evaluation value related to judgment of the quality of the laser beam as a label; and a learning means that performs supervised learning using a pair of the input data acquired by the state observing means and the label acquired by the label acquisition means as training data to construct a learning model for judging the quality of the laser beam.