The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2020

Filed:

Dec. 20, 2017
Applicants:

Hkc Corporation Limited, Shuitian Village, Shiyan Sub-district, Bao'an District, Shenzhen, Guangdong, CN;

Chongqing Hkc Optoelectronics Technology Co., Ltd., Chongqing, CN;

Inventor:

Chia-Hang Lee, Chongqing, CN;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 17/02 (2006.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
H04N 17/02 (2013.01); G06T 7/90 (2017.01); G06T 2207/10024 (2013.01);
Abstract

This application relates to a measurement method for measuring a display panel and an apparatus thereof. The measurement method for measuring a display panel includes: correcting a measurement picture of a display panel; obtaining, by using a measurement apparatus, a picture to be measured; setting a shooting instrument to complete a shooting parameter under a measurement environment; shooting and correcting system measurement data by using the shooting parameter; replacing a display panel to be measured; measuring a gamma curve; and outputting a gamma curve, where the display panel needs to be corrected only once, and a gamma curve of a next display panel continues to be measured.


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