The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
Aug. 03, 2015
Nec Europe Ltd., Heidelberg, DE;
Hanno Hildmann, Madrid, ES;
Miquel Martin Lopez, London, GB;
NEC CORPORATION, Tokyo, JP;
Abstract
A method for observing a predetermined monitoring area, wherein one or more sensing platform nodes are employed to observe a predetermined number of sub-areas of the monitoring area, includes observing the sub-areas of the monitoring area using the sensing platform nodes so as to collect measuring data for the sub-areas. A prediction model is provided for analyzing predictability of measuring data for the sub-areas based on the collected measuring data. Future measuring data is calculated for the sub-areas and uncertainty of the future measuring data over time is calculated using the prediction model. The sensing platform nodes are scheduled for observation of the sub-areas according to a scheduling mechanism. The scheduling of the sensing platform nodes is dependent on the calculated uncertainty of the future measuring data predicted for the sub-areas.