The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
Sep. 12, 2016
Fluke Corporation, Everett, WA (US);
Duncan N. Kearsley, Stanwood, WA (US);
Paul A. Ringsrud, Langley, WA (US);
Clark N. Huber, Everett, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
Analysis systems can include both a test and measurement tool for generating measurement data representative of at least one parameter of a device under test and an imaging tool for generating image data representative of a target scene. An electrical isolation mechanism can electrically isolate a user operating the analysis tool from the test and measurement circuit through the imaging tool. The electrical isolation mechanism can include an insulating coating surrounding a part of the imaging tool having an opening proximate the imaging tool so that electromagnetic radiation can enter through the opening and reach the imaging tool. The opening can be sized so that a standard finger cannot penetrate the opening to within a predetermined distance of the imaging tool. Additionally or alternatively, a window positioned over the opening can prevent access to the imaging tool via the opening.