The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
Aug. 30, 2015
Farnoud Kazemzadeh, Kitchener, CA;
Alexander Sheung Lai Wong, Waterloo, CA;
Shahid Abbas Haider, Waterloo, CA;
Farnoud Kazemzadeh, Kitchener, CA;
Alexander Sheung Lai Wong, Waterloo, CA;
Shahid Abbas Haider, Waterloo, CA;
Other;
Abstract
There is disclosed a novel system and method for multiview, multispectral, polarimetric, light-field, and high dynamic range imaging in a concurrent manner specifically capturing information at different spectral bands and light polarizations simultaneously. The present system and method is capable of () concurrent imaging of multiple spectral bands (including spectral bands beyond the visible region of the electromagnetic spectrum), proportional or greater than the number of filters used in the device, () concurrent imaging of multiple light polarizations (Stokes vectors), () acquiring images at different point-of-view of the same scene and/or object that allow for topographical reconstruction, () concurrent imaging of the multiple depth of fields that allow for light-field imaging, and () concurrent imaging of multiple simulated exposures of the detector that allow for high dynamic range imaging, all at the same time using a single sensor in the same imaging system enclosure.