The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2020

Filed:

Dec. 12, 2017
Applicant:

Epistar Corporation, Hsinchu, TW;

Inventors:

Tsun-Kai Ko, Tainan, TW;

Schang-Jing Hon, Tainan, TW;

Chien-Kai Chung, Tainan, TW;

Hui-Chun Yeh, Tainan, TW;

An-Ju Lin, Tainan, TW;

Chien-Fu Shen, Tainan, TW;

Chen Ou, Hsin-Chu, TW;

Assignee:

EPISTAR CORPORATION, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 33/06 (2010.01); H01L 33/14 (2010.01); H01L 33/22 (2010.01); H01L 33/38 (2010.01); H01L 33/42 (2010.01); H01L 33/44 (2010.01);
U.S. Cl.
CPC ...
H01L 33/387 (2013.01); H01L 33/06 (2013.01); H01L 33/14 (2013.01); H01L 33/22 (2013.01); H01L 33/382 (2013.01); H01L 33/42 (2013.01); H01L 33/44 (2013.01); H01L 2924/0002 (2013.01);
Abstract

An optoelectronic semiconductor device comprises a substrate; a semiconductor system including a first conductivity layer and a second conductivity layer, wherein the second conductivity layer comprises a top surface, and in a top view of the semiconductor system, an outline of the first conductivity layer surrounds an outline of the second conductivity layer; a first electrical connector on the first conductivity layer; a second electrical connector comprising a top view shape and directly contacting the second conductivity layer; a contact layer contacting the top surface of the second conductivity layer and having an outer perimeter at an inner side of the outline of the second conductivity layer in the top view of the semiconductor system; and a discontinuous region contacting the top surface of the second conductivity layer, wherein the contact layer covers a top surface and sidewalls of the discontinuous region.


Find Patent Forward Citations

Loading…