The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2020

Filed:

Nov. 23, 2018
Applicant:

Wonik Ips Co., Ltd., Pyeongtaek-si, Gyeonggi-do, KR;

Inventors:

Chang Hak Shin, Pyeongtaek-si, KR;

Young Chul Choi, Hwaseong-si, KR;

Assignee:

WONIK IPS CO., LTD., Pyeongtaek-si Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/033 (2006.01); H01L 21/02 (2006.01); C23C 16/50 (2006.01); C23C 16/24 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02592 (2013.01); C23C 16/24 (2013.01); C23C 16/50 (2013.01); H01L 21/0262 (2013.01); H01L 21/02488 (2013.01); H01L 21/02532 (2013.01);
Abstract

Provided is a method of forming an amorphous silicon layer, the method including supplying a reaction gas and an inert gas onto a substrate having an underlayer thereon, and stabilizing the gases while power for generating plasma is not being applied to a chamber, depositing an amorphous silicon layer on the underlayer by using plasma of the reaction gas, which is generated by applying a high-frequency (HF) power of 500 W to 700 W and, at the same time, applying a low-frequency (LF) power lower than the HF power to the chamber, providing a purge gas into the chamber, and pumping the chamber.


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