The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2020

Filed:

Oct. 20, 2016
Applicant:

Technische Universiteit Eindhoven, Eindhoven, NL;

Inventor:

Otger Jan Luiten, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/285 (2006.01); H01J 37/073 (2006.01);
U.S. Cl.
CPC ...
H01J 37/285 (2013.01); H01J 37/073 (2013.01); H01J 2237/083 (2013.01); H01J 2237/2626 (2013.01);
Abstract

In one aspect, the present invention provides a method of generating an electron beam in a transmission electron microscopy device. The method includes: generating an electron pulse [] by a pulsed electron source [], accelerating the electron pulse in a first resonant microwave cavity [], passing the accelerated electron pulse through a drift space [], and correcting the energy spread of the accelerated electron pulse in a second resonant microwave cavity [] by operating it out of phase by 90 degrees from the first resonant cavity [


Find Patent Forward Citations

Luiten, Otger. (2020). Electron beam generation for transmission electron microscope (U.S. Patent No. 10529536). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10529536

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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