The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2020

Filed:

Feb. 03, 2017
Applicant:

Moxtek, Inc., Orem, UT (US);

Inventors:

Dustin Peterson, Spanish Fork, UT (US);

Richard Zimmerman, Payson, UT (US);

Vince Jones, Cedar Hills, UT (US);

Eric Miller, Provo, UT (US);

Assignee:

Moxtek, Inc., Orem, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 35/14 (2006.01); H01J 35/16 (2006.01); H01J 37/065 (2006.01); H01J 35/06 (2006.01); H01J 37/21 (2006.01); H01J 37/063 (2006.01); H01J 37/15 (2006.01); H05G 1/52 (2006.01);
U.S. Cl.
CPC ...
H01J 35/14 (2013.01); H01J 35/066 (2019.05); H01J 35/147 (2019.05); H01J 35/153 (2019.05); H01J 35/165 (2013.01); H01J 37/063 (2013.01); H01J 37/065 (2013.01); H01J 37/15 (2013.01); H01J 37/21 (2013.01); H05G 1/52 (2013.01); H01J 2229/4813 (2013.01); H01J 2229/4831 (2013.01); H01J 2229/70 (2013.01); H01J 2229/8901 (2013.01); H01J 2237/032 (2013.01); H01J 2237/083 (2013.01); H01J 2237/2482 (2013.01);
Abstract

Electron beam spot characteristics can be tuned in each x-ray tube by moving a focusing-ring along a longitudinal-axis of the x-ray tube. The focusing-ring can then be immovably fastened to the x-ray tube. An x-ray source can include an x-ray tube and a focusing-ring. The focusing-ring can at least partially encircle an electron-emitter, a cathode, an evacuated-enclosure, or combinations thereof. The focusing-ring can be located outside of a vacuum of the evacuated enclosure. The focusing-ring can adjust an electron-beam spot on a target material of the x-ray tube when moved along a longitudinal-axis extending linearly from the electron-emitter to the target material.


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