The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2020

Filed:

Jul. 18, 2018
Applicant:

SK Hynix Inc., Icheon-si, Gyeonggi-do, KR;

Inventors:

Soo Young Jang, Seoul, KR;

Jin Youp Cha, Seoul, KR;

Assignee:

SK hynix Inc., Icheon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/12 (2006.01); G11C 11/34 (2006.01); G11C 29/18 (2006.01); G11C 29/56 (2006.01); G01R 31/26 (2014.01); G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 29/12015 (2013.01); G01R 31/2642 (2013.01); G11C 11/34 (2013.01); G11C 29/18 (2013.01); G11C 29/56012 (2013.01); G11C 2029/4402 (2013.01); G11C 2029/5602 (2013.01);
Abstract

A system may include a first semiconductor apparatus and a second semiconductor apparatus. Each of the first and second semiconductor apparatuses may receive reference data and a first clock signal. The first semiconductor apparatus may generate a first internal clock signal from the first clock signal, and may output the reference data as transmission data based on the first internal clock signal. The second semiconductor apparatus may generate a second internal clock signal from the first clock signal, and may receive the transmission data based on the second internal clock signal. The second semiconductor apparatus may generate an error detection signal based on the received data and the reference data.


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