The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
Jun. 14, 2016
Sap SE, Walldorf, DE;
Viren Kumar, Vancouver, CA;
Amir Hajizadeh, Vancouver, CA;
SAP SE, Walldorf, DE;
Abstract
Overlay visualizations are implemented utilizing data of a data layer. A table comprises a measure and two or more different dimensions mapping to a same value range. For visualization, the measure for those dimensions may be plotted along a common axis in a same chart. Accordingly, a query executes a UNION of multiple subqueries. A first subquery aggregates the first dimension over the value range, injecting a constant formula field to identify the original first dimension. A second subquery aggregates the second dimension over the value range, again injecting the constant formula field to identify the original second dimension. UNION of these subquery results presents one larger dataset for input to the overlying visualization layer. The constant formula field may be relied upon to differentiate between the combined dimensions on the common axis, allowing association of the measure values with the original dimensions in the displayed plot (e.g., via coloring).