The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
Jan. 26, 2018
Applicant:
Gorilla Technology Inc., Taipei, TW;
Inventors:
Assignee:
GORILLA TECHNOLOGY INC., Taipei, TW;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06T 7/73 (2017.01); G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06K 9/00228 (2013.01); G06K 9/00255 (2013.01); G06K 9/00771 (2013.01); G06K 9/3208 (2013.01); G06K 9/3258 (2013.01); G06T 7/74 (2017.01); G06K 2209/15 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30168 (2013.01); G06T 2207/30201 (2013.01); G06T 2207/30252 (2013.01);
Abstract
The present invention discloses a method of evaluating image quality taken in an actual scene, the method comprising: providing a test chart placed in an actual scene, said test chart comprising a plurality of positioning patterns and a plurality of quality test patterns; capturing an image of the test chart in the actual scene; searching the plurality of positioning patterns in the image of the test chart to locate the orientation of the image of the test chart; and identifying the plurality of quality test patterns in the located image of the test chart and evaluating the image quality of the plurality of quality test patterns.