The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
Aug. 30, 2017
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Namseop Kwon, Suwon-si, KR;
Byunghoon Na, Suwon-si, KR;
Yonghwa Park, Yongin-si, KR;
Jangwoo You, Seoul, KR;
Heesun Yoon, Incheon, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G01S 17/89 (2006.01); G01S 17/08 (2006.01); G01S 7/491 (2006.01); H04N 5/33 (2006.01); G06T 5/20 (2006.01); G01S 7/493 (2006.01); G01S 7/497 (2006.01);
U.S. Cl.
CPC ...
G06T 5/003 (2013.01); G01S 7/493 (2013.01); G01S 7/497 (2013.01); G01S 7/4915 (2013.01); G01S 17/08 (2013.01); G01S 17/89 (2013.01); G06T 5/20 (2013.01); H04N 5/33 (2013.01); G06T 2207/10028 (2013.01);
Abstract
A time of flight (ToF) measuring apparatus and an image processing method for reducing blur of a depth image in the ToF measuring apparatus are provided. The apparatus senses infrared (IR) light reflected by a subject and incident via an optical shutter, models a spread characteristic of the IR light based on an intensity distribution of the sensed IR light, and acquires a sharpening filter by using the modeled spread characteristic.