The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
May. 29, 2015
Fair Isaac Corp., San Jose, CA (US);
Scott M. Zoldi, San Diego, CA (US);
David Griegel, San Diego, CA (US);
Fair Isaac Corporation, San Jose, CA (US);
Abstract
The subject matter disclosed herein provides methods, apparatus, systems, techniques, and articles for false positive reduction in abnormality detection models. A date and time of a first transaction by a transaction entity and associated with a transaction characteristic can be stored. Data representing subsequent transactions associated with the transaction characteristic can be stored. A history marker profile specific to the transaction characteristic and transaction entity can be generated and can include the transaction characteristic, the date and time of the first transaction, and maximum and mean abnormality scores. A date and time of a current transaction can be determined. A current abnormality score for the current transaction can be received. A tenure of the observed transaction characteristic can be computed. The current abnormality score can be recalibrated from the transaction entity abnormality detection system according to the maximum, mean, and current abnormality scores and a length of the tenure.