The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2020

Filed:

Feb. 20, 2018
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Masahiko Sugimura, Kawasaki, JP;

Susumu Endo, Kawasaki, JP;

Hiroaki Takebe, Kawasaki, JP;

Takayuki Baba, Kawasaki, JP;

Yusuke Uehara, Kawasaki, JP;

Yasutaka Moriwaki, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06T 7/73 (2017.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4671 (2013.01); G06K 9/6211 (2013.01); G06K 9/6212 (2013.01); G06K 9/6215 (2013.01); G06T 7/73 (2017.01);
Abstract

There is provided a distance measuring apparatus including a storing unit configured to store a first image and a second image to be compared with one another; and a calculating unit configured to extract a plurality of feature points from each of the first image and the second image, extract a combination of feature points with high stability of feature values amongst the plurality of feature points in the first image and a combination of feature points with high stability of feature values amongst the plurality of feature points in the second image, and output, as bit strings, the feature values associated with the combination extracted from the first image and the feature values associated with the combination extracted from the second image.


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